Supplier will provide the following: 9.1 Micro-XRF Instrument 9.1.1 Spot size: ≤ 20 μm (preferably 10 μm for high-resolution mapping). 9.1.1.1 Spot size: 5–20 μm adjustable. 9.1.2 X-ray source: Micro-focus tube with selectable filters. 9.1.3 Detector: Silicon Drift Detector (SDD), large active area (≥ 30 mm²), high count rate. 9.1.3.1 Detection limits: ppm-level for most elements (F-U) 9.1.4 Chamber: Vacuum capability for light element detection; large stage for varied sample sizes. 9.1.5 Stage: Motorized XYZ with mapping capability (mosaic and line scans). 9.1.5.1 Mapping area: ≥ 30 cm × 30 cm. 9.1.6 Safety: Radiation shielding, interlocks, compliance with local regulations. 9.1.6.1 Compliance: CE marking and radiation safety standards. 9.2 Software 9.2.1 Advanced elemental mapping and imaging 9.2.2 Quantitative analysis using fundamental parameters 9.2.3 Automated routines for batch analysis 9.2.3.1 Export options for raw data and reports 9.2.3.2 Mineral identification (preferred)
