Specifications include, but are not limited to: Bids are requested for a Scanning Electron Microscope (SEM). This must either be a compact floor-standing device (up to 1m x 1m footprint) or a benchtop device. The SEM will be used primarily for high-throughput microstructure analysis and compositional EDX analysis of metallic polycrystalline and amorphous material samples. To this end, the SEM must have an Automation Interface, which allows to perform all SEM and EDX functions through scripting in a common programming language, preferably Python. Conditions of bid which include the word “must” or “shall” describe a mandatory requirement. All specifications are defined as mandatory minimum requirements unless otherwise stated. FAILURE TO MEET A MANDATORY REQUIREMENT SHALL DISQUALIFY YOUR BID. If no bidder is able to comply with a given specification, condition of bid or provide a specific item/service requested, Purchasing reserves the right to delete that specification, condition of bid or item without having to complete the bid process again. ITEM DESCRIPTION YES NO 1. Instrument Formfactor: 1a Compact floor-standing or benchtop (up to 1m x 1m footprint). 2. Detectors: 2a Must have a Secondary Electron Detector (SE). 2b Must have a Backscatter Electron Detector (BSE). 2c Must have a fully integrated Energy Dispersive X-ray Spectroscopy Detector (EDX). 2d All three detectors must operate at the same working distance, to enable a fast workflow both for high resolution imaging and compositional analysis. 3. Electron Source: 3a Must either be a thermionic source (i.e. LaB6 or CeB6) or a field emission gun. (NOTE: Tungsten filaments do not meet the requirements) 4. Imaging Conditions: 4a Electron beam must be adjustable to different beam current settings. 4b Electron beam must be adjustable to an accelerating voltage ranging at least between 5kV to 20kV. 5. Other Equipment Requirements: 5a Sample chamber and stage must be of sufficient size and travel range in x and y direction to accommodate a maximum sample size of 100mm x 100mm and allow imaging across the entire sample area. 5b Sample stage must allow accommodating at least 10 standard 1/2" sample pin stubs at the same time. More than 10 is acceptable. 5c Manual position adjustment of the stage in the z-direction is sufficient and permissible, motorized is preferred. 5d Stage tilt and rotation are not required. 5e SEM must be able to be equipped with a eucentric stage (The Eucentric stage is not part of this purchase – only a future consideration if needed)...
