The building is equipped with following electricity, if machine cannot operate using the supplied power, a transformer or phase changer as necessary must be included in the quote: • 480/277 Volt, 3PH 60Hz (30 amps max) • 240/120 Volt, 1PH 60Hz (15 amps max) • 208/120 Volt, 3PH 60Hz (70 amps max) EQUIPMENT SPECIFICATIONS: 1- SEM: • Electron Source: Tungsten filament • Acceleration Voltage: 1 kV to 20 kV (variable) • Magnification Range: 10X to 100,000X • Resolution: ~15 nm (secondary electron mode), ~30 nm (backscattered electron mode) • Detectors: Secondary Electron (SE) and Backscattered Electron (BSE) detectors • Sample Stage: Motorized 5-axis (X, Y, Z, Tilt, Rotation) • Sample Size Capacity: Up to ~70 mm diameter × 50 mm height • Vacuum System: Oil-free diaphragm and turbo molecular pump • Vacuum Level: 10-3 to 10-4 Pa • Operating Modes: High vacuum and low vacuum modes (for non-conductive samples) • Imaging Modes: SE, BSE, and mixed imaging • Image Resolution: Up to ~3072 × 2304 pixels • Auto Functions: Auto focus, auto brightness/contrast, auto stigmation • User Interface: Touchscreen or PC-based control software (Windows compatible) • Image Output Formats: TIFF, JPEG, BMP, and CSV (for EDS data) 2- EDS: • Detector Type: Silicon Drift Detector (SDD) • Detector Area: 10 mm² to 30 mm² • Energy Resolution: ~125–135 eV at Mn Kα • Energy Range: 0–20 keV • X-ray Window: Ultra-thin polymer window • Count Rate: Up to ~200,000 counts per second (cps) • Detector Cooling: Thermoelectric cooling — no liquid nitrogen required • Working Distance: Optimized for 8–10 mm • Element Detection Range: From boron (B, Z=5) to uranium (U, Z=92) • Correction Method: ZAF or φ methods • Mapping and Line Scan: Real-time elemental mapping and line profile acquisition • Live Spectrum Display: Spectrum updates in real time during SEM imaging • Light element detection optimization • Advanced quantification software modules • Spectrum imaging overlay with SE/BSE images • System Integration: Fully synchronized with SEM for point analysis and area mapping • Vacuum Compatibility: Operates in both high and low vacuum SEM modes
