Specifications include, but are not limited to: The University is requesting an X‐ray Photoelectron Spectrometer to meet the following minimum specifications: Capability to perform X‐ray photoelectron spectroscopy experiments from a broad range of samples over large and small areas with and without spatial resolved features of the order of 1µm; ideally the system should include low and high energy monochromatic X‐ray sources for non‐destructive film thickness analyses. Capability to perform Ultraviolet Photoelectron Spectroscopy. The UPS capability should be able to automatically switch from He (I) to He (II) excitation without user intervention to provide maximum analytical flexibility. Capability to perform ion sputter depth profiling of organic and inorganic materials with, preferably, a single high energy multi‐mode argon/argon gas cluster ion source.