This is a COMBINED SYNOPSIS/SOLICITATION for commercial supplies with services, prepared in accordance with the information in FAR Subpart 12.6, Streamlined Procedures for Evaluation and Solicitation of Commercial Items and FAR Part 13, Simplified Acquisition Procedures as supplemented with the additional information included in this notice. This announcement constitutes the only solicitation; a written solicitation will not be issued.
PAPER COPIES OF THIS SOLICITATION WILL NOT BE AVAILABLE. This combined synopsis/solicitation SHALL be posted on SAM.gov (https://sam.gov/).
The reference number is N0018926Q0002. This solicitation documents and incorporates provisions and clauses in effect through FAC 2025-06 (effective 1 October 2025) and DFARS Publication Notice 20251110 (effective 10 November 2025). It is the responsibility of the contractor to be familiar with the applicable clauses and provisions. The clauses may be accessed in full text at these addresses:
https://www.acquisition.gov/browse/index/far
http://www.acq.osd.mil/dpap/dars/dfarspgi/current/index.html
The NAICS code is 334516 (Analytical Laboratory Instrument Manufacturing) and the Small Business Standard is 1,000 employees. The proposed contract requirement is to purchase one (1) atomic force microscope (AFM) for advanced cutting-edge research in high-resolution imaging and quantitative nanoscale characterization of surfaces on behalf of the United States Naval Academy (USNA), Annapolis, MD., for which the Government intends to solicit and award a Firm-Fixed-Price (FFP) contract to the quoter that is most advantageous to the Government. This requirement will be solicited on a sole source basis with approval from the Small Business Administration to Bruker Nano, Inc.
This notice of intent is not a request for competitive proposals. However, interested persons may identify their interest and capability to respond to the requirement or submit proposals. All bids, proposals, or quotations received by the closing response date will be considered by the Government.
See attached documents for more information
