Specifications include, but are not limited to: NX10 Complete AFM System Complete Atomic Force Microscope system for small and medium size samples, consisting of flexure-guided XY scanner, standard NX AFM head with decoupled flexure-guided Z scanner, sample mount, motorized XY stage, motorized Z stage, motorized focus stage, direct on-axis optics, NX control electronics, SmartScanTM software, XEI software, computer, monitors and accessories. 1 010-0260 50 urn XY Scanner — DEFAULT • Flexure-guided XY scanner structure for the sample scanning and positioning, separated from the topography feedback mechanism of the Z scanner • Flexure-guided structure minimizes background curvature • Default XY Scanner • XY scan range: 50 pm x 50 p.m typical • Closed-loop feedback control for precise XY positioning • 20-bit XY position control and 24-bit XY positioning sensor