The University of Iowa (hereafter, The University/University) located in Iowa City, Iowa, desires to obtain written proposals from qualified Suppliers to provide a fully automated sequential wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer. The intended use of the WD-XRF is materials testing and analysis of samples in the form of fused beads, pressed pellets, loose powders, polished slab samples, thin films, air filters and liquids. Analytical methods will include bulk analysis, large and small spot mapping and small spot/inclusion testing. The WD-XRF will be able to perform qualitative, “standardless” semi-quantitative and standards based quantitative analysis by empirical and fundamental parameter methods, with or without calibration against certified standards. It is required proposed equipment's x-ray tubes meet the following performance requirements. Contain an X-ray tube that will be a 4 kw Rh tube with a Be window of no more than 50 micron thickness. Meet the X-ray tube stability parameters of ±0.005% at ±10% input variations. Meet the operable range of 20 kV – 60 kV X-ray tube voltages (1 kV increments) and 10 mA – 150 mA X-ray tube currents (1 mA increments).