Specifications include, but are not limited to: Electron microscopy type must be Table top scanning electron microscope Secondary Electron (SE) resolution must be < 15 nm or better Back Scatter Electron (BSE) resolution must be < 10 nm or better Accelerating voltage range must be Variable in between 1 – 15 kV or better SEM has Secondary Electron Detector (SED) SEM has Back Scatter Electron Detector (BSE) SEM has Energy Dispersive X-ray Spectroscopy (EDS) Magnification range must be 50 x to 100,000 x or better Vacuum system must be Electrical pump/oil free pump / roughing pump Specimen chamber vacuum must be 0.15 to 0.5 torr Electron gun must be Pre-centered cartridge tungsten filament Specimen stage must be X, Y, Z, Rotation of 360 degree, Tilt -15 degrees to +40 degrees Specimen holder must be Standard specimen SEM holder Specimen stage control must be Computer controlled or manual Max sample size must be 60 mm Max sample thickness must be 40 mm